VI Systems launches opto wafer test services at Photonics West 2016

VI Systems launches opto wafer test services at Photonics West 2016

VI Systems launches opto wafer test services at Photonics West 2016

VI Systems new semi-automatic wafer prober station performs high-speed electrical and optical testing of wafers early in the manufacturing process. The system reduces manufacturing costs by eliminating out of specification wafers before they have been cut and packaged to improve yield. The news wafer services also include high speed characterization on wafer level. SPIE Photonics West conference will take place from February 16-18, 2016 in San Francisco, CA.

See the overview of our characterization services here.

BERLIN, Germany, December 8, 2015
VI Systems GmbH, a leader in high performance optical semiconductor components expands the service portfolio for optic semiconductor wafers of up to 6 inch. The new semi-automatic wafer prober station performs high-speed electrical and optical testing of wafers early in the manufacturing process. The test parameters include optical output power and optical spectrum. Electrical parameters which can be tested include operation voltage, bias voltage, drive current and dark current. In addition high frequency characterization test of up to 38 GHz can be performed including digital transmission experiments of up to 64 Gbit/s. The new facilities also include nearfield and farefield analysis tools as well microscopic characterization equipment.

SPIE Photonics West conference will take place from February 16-18, 2016 in San Francisco, CA .

Visit VI Systems at the exhibition in the south hall in booth #4147.

Press Contact:
George Schaefer
VI Systems GmbH
Hardenbergstrasse 7
10623 Berlin, Germany
phone: +49 30 30 831 43 41
fax: +49 30 30 831 43 59
email: George.Schaefer@v-i-systems.com

Next Post Previous Post