VI Systems completes 28G VCSEL reliability study

VI Systems completes the reliability study of the V25-850C VCSEL chip for data rates of up to 28 Gbit/s. The study confirmed that the VCSEL chips can be used in constant operation at elevated temperatures with a useful lifetime with a Mean Time to Failure (MTTF) value of more than 35 years.

BERLIN, Germany, May 27, 2014

VI Systems GmbH, a leader in ultra-high speed components for data communications,
completes the reliability studies for the V25-850Cxx chip series for up 28 Gbit/s per channel. The chip is available for 100 Gbit/s parallel data transmission at 4  x 25 Gbit/s with  part number V25-850C4 and for the next generation of Infiniband EDR interconnects of up  to 300 Gbit/s at 12 x 25.78 Gbit/s with part number V25-85012. The company also offers samples for next generation of 400 Gbit/s Ethernet interconnects at 16 x 25 Gbit/s
The reliability study was performed in the format of a multi-cell accelerated aging test which included 500 pcs of individual chips which have been operated at temperature of up to 150 degree C at three different current density levels.

As a conclusion it was observed that for operation at usual operation conditions of 45°C and 18kA/cm^2 the systematic lifetime is virtually infinite. In case of constant operation at elevated heat sink temperatures (30% humidity, compact environment),  a reasonable useful lifetimes with MTTF values of more than 35 years for ambient (heatsink) temperatures of up to 90°C can be derived.  EZconn Czech a.s. provided the testbed facility and data acquisition.
The study is available from the company website at:
https://v-i-systems.com/_data/Reliability_Report_V25-850_VCSEL_short_version.pdf

Contact:
George Schaefer
VI Systems GmbH
Hardenbergstrasse 7
10623 Berlin, Germany
phone: +49 30 30 831 43 41
fax:    +49 30 30 831 43 59
email:  George.Schaefer@v-i-systems.com