Last week Prof. Arndt Jaeger and co-workers presented a poster at the DPG conference in Regensburg/Germany with the title: “Acquisition and analysis of photocurrent spectra for 850 nm oxide-confined vertical-cavity surface-emitting lasers”. Together we work on the development of non-destructive characterization techniques for optoelectronic components centered on photocurrent spectroscopy.
Authors: Arndt Jaeger1, Marwan Bou Sanayeh2, Helmut Meinert1, •Manuel Haerer1, Oleg Yu. Makarov2, Ilya E. Titkov2, Nikolay Ledentsov Jr.2, and Nikolay N. Ledentsov2 — 1Esslingen University of Applied Sciences, Flandernstrasse 101, 73732 Esslingen, Germany — 2VI Systems GmbH, Hardenbergstrasse 7, 10623 Berlin, Germany
Vertical-cavity surface-emitting lasers (VCSELs) are of utmost importance as key components for high-speed datacom, sensor and free-space applications. Therefore, for a successful further optimization of their performance, understanding their aging behavior is of crucial importance. The 850 nm oxide-confined VCSELs used in this study were intentionally operated at extreme conditions to accelerate their degradation until reaching optical damage. For monitoring operation-induced changes, a photocurrent spectroscopy (PCS) setup was established and applied before and after accelerated aging. The PCS results at different reverse biases reveal changes that can be explained by non-radiative recombination centers generated during accelerated aging. This finding contributes to the understanding of the aging mechanisms in these tiny devices.