We provide services in characterisation of vast variety of optical components.
- Static characterisation: L-I-V, optical spectra, dark current test
- Analysis using microscopy tools (FIB / TEM / SEM)
- Full Wafer Mapping
- Ageing Tests
Optical and Mechanical Inspection
We offer a range of inspection tools to determine the properties of optical components. Our laboratory is equipped with conventional optical microscopes with a magnification of up to 1000 times. More complex studies using focused ion beam (FIB), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are performed with external test partners.