Characterisation

We provide services in characterisation of vast variety of optical components.

• Frequency response measurements up to 40 GHz
• Data transmission test of up to 64 Gbit/s (NRZ or 4-PAM)
• Near- and farfield studies

• Static characterisation: L-I-V, optical spectra, dark current test
• Analysis using microscopy tools (FIB / TEM / SEM)
• Full Wafer Mapping
• Ageing Tests

Optical and Mechanical Inspection

We offer a range of inspection tools to determine the properties of optical components. Our laboratory is equipped with conventional optical microscopes with a magnification of up to 1000 times. More complex studies using focused ion beam (FIB), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are performed with external test partners.