Far- and Near-Field Characterisation

Testing of optical emission characteristics

Our test station setup allows nearfield and farfield analysis of light emitting devices at temperatures of up to 150°C with a special interference-free infrared optics and camera. Nearfield measurements are performed to determine emitting diameter and mode emission characteristics as well as the measurement of mode field diameter and polarization characteristics. Farfield measurements provide information on the angular distribution of power and the overall emission characteristics as well as the  maximum emission angle.